The instrument is used to measure the size of dendrites on rough metallic surfaces. The size of dendrites is between 0.5 and 3 nanometer. Semiconductor chips are sorted into 4 qualities depending on the size and refractive index of the dendrites. Direct after measurement semiconductor chips with unacceptable lifetime prognosis are stamped out.


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Instruments for Production

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Lifetime Diagnostics of Semiconductor Chips (1) Lifetime Diagnostics of Semiconductor Chips (3)