The instrument is used to measure the size of dendrites on rough metallic surfaces. The size of dendrites is between 0.5 and 3 nanometer. Semiconductor chips are sorted into 4 qualities depending on the size and refractive index of the dendrites. Direct after measurement semiconductor chips with unacceptable lifetime prognosis are stamped out.
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Measurement of Roof Tiles Coatings (3)
Lifetime Diagnostics of Semiconductor Chips (1)
Lifetime Diagnostics of Semiconductor Chips (2)