$The instrument is used to measure the size of dendrites on rough metallic surfaces. The size of dendrites is between 0.5 and 3 nanometer. Semiconductor chips are sorted into 4 qualities depending on the size and refractive index of the dendrites. Direct after measurement semiconductor chips with unacceptable lifetime prognosis are stamped out.$

The instrument is used to measure the size of dendrites on rough metallic surfaces. The size of dendrites is between 0.5 and 3 nanometer. Semiconductor chips are sorted into 4 qualities depending on the size and refractive index of the dendrites. Direct after measurement semiconductor chips with unacceptable lifetime prognosis are stamped out.

Instruments for Production

Picture size (width)	First picture	Previous picture	Picture No.	Next picture	Last picture	Jump to pic No.
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		Measurement of Roof Tiles Coatings (3)	Lifetime Diagnostics of Semiconductor Chips (1)	Lifetime Diagnostics of Semiconductor Chips (2)